DATS3310 is a high Speed In-Circuit Functional Tester.
This tester can do in-circuit test on all digital logic devices working between +/-12V.
All TTL & CMOS devices ranging from simple gates to Counters, latches, flip-flops,
multiplexers & demulti plexers, memory devices like PAL, RAMS, EPROMs and certain LSI chips can be tested effectively using this test systems.
Even analog devices like Op-amps, Comparators, ADCs, DACs can also be tested. DATS 3310 has a 2 channel VI trace comparison method for testing
all the passive devices on the board in comparison with a Good Working Board. This test system comes with a maximum of 32 pins.
High Speed In-Circuit functional tester
Affordable and easy to use
Functional tests for devices both In-Circuit and Out-Circuit
Out Circuit devices self Powered
Capable of testing Digital and Analog devices
VI trace for live comparison of good & faulty PCBs
Includes Loop test, Identity, Contact test & voltage test
USB 2.0 interface
Windows 8 operating system software
Extensive device test library
Can be interfaced to DIP, SOIC, QFP, PLCC test clips for testing various device packages